http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1450127-A2

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_af5a7b293d03cf571bda1e0e1de22969
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B15-02
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B15-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01B13-00
filingDate 2004-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4261399060a4d7acb5371022ba213434
publicationDate 2004-08-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1450127-A2
titleOfInvention Method and device to measure the thickness of the isolation in flat cables
abstract Method for determining the thickness of the insulation of a flat cable in the area of the metallic conductor tracks, whereby one side of the flat cable is irradiated by means of an X-ray beam and a detector on the same side or on the opposite side of the flat cable measures the intensity of the X-ray luminescence radiation emitted by the respective conductor track, whereby the detector is shielded from the x-rays.
priorityDate 2003-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S57113313-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID26124
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID226408122

Total number of triples: 18.