http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1412768-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ab46a2fe1c732dd876578722a84bed6c |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3016 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K5-133 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2882 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R13-345 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K5-13 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R13-34 |
| filingDate | 2002-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2011-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2d96cf55cfca839266473a7b8ba97ccc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_abe1531065bdeaf733458eae561fd5c5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0e439c18b9039ded0c980c2d9101ea21 |
| publicationDate | 2011-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-1412768-B1 |
| titleOfInvention | System and method for delay line testing |
| abstract | A circuit generates a test signal useful in verifying the actual delay values of individual delay stages in a digital delay line. In general, the cumulative delay of the delay line defines a window in time having its zero point anchored to the beginning of the delay line. Successive delay stages correspond to successive time bins within the overall time window. The test signal shifts at a known, linear rate in time with respect to a reference signal, which is used to initiate a test cycle. The reference signal synchronizes sampling of the test signal to the beginning of the time window. Samples of the test signal are taken at sample points determined by the actual time delays in the successive delay stages. The observed distribution of test signal edges across the time window may be used to determine the actual delay intervals of the delay line. |
| priorityDate | 2001-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID129094391 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID549976 |
Total number of triples: 22.