| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_43e9bc481473b7735d51aacc3e34fbba |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-49126 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07342
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07378
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07314
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07357 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2002-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aa7a51d59c89ac01fdbfcfefffdb6d11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_125caccb9ed1074f883280ccc7e59085
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a69e772b55e4deb53e1dad2f5a9b29f4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_450e53d4aeeb21656c276a87f1d74c3e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b0557ea68407ab42287bde1b00a83e0d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_38d94f74f2210fe42bda47ddce6af42a |
| publicationDate |
2004-04-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1407280-A1 |
| titleOfInvention |
Method of manufacturing a probe card |
| abstract |
A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2645113-A3 |
| priorityDate |
2001-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |