Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_85adbf818283df4f97d3cf24a9b461d1 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61L2-07 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A23L3-3571 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A23L3-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A23L3-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A23L3-003 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61L2-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61L2-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61L2-28 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A23L3-3571 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A23L3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A23L3-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61L2-07 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61L2-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A23L3-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61L2-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61L2-28 |
filingDate |
2003-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2006-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a525a28ff8f0ecbf3379f0a3e08a5c88 |
publicationDate |
2006-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-1342478-B1 |
titleOfInvention |
Method of modeling sanitation levels in food processing equipment |
abstract |
A method of creating a sanitation level model with respect to a predefined microorganism in food processing equipment is provided. The method includes generally three steps. First, a temperature history during a use cycle of the food processing equipment is created. The temperature history includes a collection of a plurality of temperatures that the food processing equipment undergoes during the use cycle. The use cycle includes a normal use stage, a sanitizing stage, and perhaps an idle stage. Second, a growth model of the microorganism is continuously applied to each applicable temperature in the temperature history. Third, a death model of the microorganism is continuously applied to each applicable temperature in the temperature history. The created sanitation level models is used to ascertain the microorganism growth/death rate in the food processing equipment during the use cycle. <IMAGE> |
priorityDate |
2002-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |