| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_514cea3c148c1da2542f7b643eee8697 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B18-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K2103-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K2103-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2018-00904
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F2009-00897
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F9-00817
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F2009-00844 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K26-382
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K26-032
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K26-389
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K26-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B23K26-0624
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F9-008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F9-00825 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61F9-008 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B23K26-03
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B23K26-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61F9-007
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B23K26-38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61N5-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B18-20 |
| filingDate |
2001-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9ee847a82aa550bd06ebf0ca304f59af |
| publicationDate |
2003-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1339522-A1 |
| titleOfInvention |
Laser ablation |
| abstract |
The invention provides a method for measuring in situ the amountof material removed by laser ablation with ultrshort laser pulses. The method relies on the geometrical information provided by the backscattered light from the ablating laser. The temporal structure of the backscattered laser light is used to provide an accurate measure for the depth of the ablated area, since the round-trip time for the short laser pulses uniquely determines the distance to the object under illumination. For femtosecond laserpulses a depth resolution of a few micrometers can be achieved. According to the invention, imaging of the backscattered light from a single ablating pulse provides all the information necessary to derive a cross-sectional profile across the ablated region. |
| priorityDate |
2000-11-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |