http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1264169-B1

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filingDate 2001-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2009-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9d496760979944e0eb911abdb87f933
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publicationDate 2009-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1264169-B1
titleOfInvention Improvement of spectral and/or spatial resolution in a laser scanning microscope
abstract The invention relates to a method for optically detecting characteristic values of an illuminated specimen. According to the invention, the signal backscattered, reflected and/or fluoresced and/or transmitted by the specimen is detected by means of a spatially resolved detector by imaging the radiation arriving from the specimen onto the detector. The position of the radiation that is measured in a spatially resolved manner is shifted relative to the detector. Intermediate values are detected for the purpose of increasing the spatial resolution of the detector on the basis of the signals measured during different shifts using an algorithm. The increment of shift is advantageously smaller than the grid spacing of the spatial resolution of the detector. A shift of the detector in direction of its spatial resolution and/or a shift or swiveling of an imaging element in at least one axis and/or of a reflective element in at least one axis and/or of a dispersive element in at least one axis is carried out and a spectrally resolved measurement of spectra is made by means of a dispersive element mounted upstream of the detector.
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