| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_966a6c1f382ec9bcb5e3839dfd73e5b8 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-14552
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-14542
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-14556
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6408 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-45
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-1455
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-145
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-0285
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64 |
| filingDate |
2000-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2004-01-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b69e7ac5b8e642ad5c4ca9385371c2f |
| publicationDate |
2004-01-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1241979-B1 |
| titleOfInvention |
Method and device for determining local distribution of a measuring parameter |
| abstract |
The invention relates to a method and a device for determining local distribution of a measuring parameter relative to or in a predefined, flat measuring area pertaining to a biological sample, preferably of an organ surface or the epidermis. In a first measuring method for determining a first measuring parameter, a sensor film with a luminescence indicator reacting to the measuring parameter with modification of at least one optical characteristic is applied to a flat measuring area and a first measuring parameter is detected by imaging means. A second optical measurement method is carried out, wherein the sensor film is used to determine the local distribution of at least one second measuring parameter in the same measuring range either simultaneously or directly afterwards. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102015106806-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102015106806-B4 |
| priorityDate |
1999-12-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |