| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c0f7e3fa7ac7395dee357c166ef30e65
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4dbb7363d8fd3c8a25f9b4f448d319b1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_90acaf49ca080b36f3dea75e97da5857 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-455
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-958 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-896
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-45
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-958 |
| filingDate |
2002-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e372a470466121f9b7320e8f8539e13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_53131c174465dd9a78ef9f27e6c372c4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ffc03674ae13c809ec1381bff433100
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_60f4ae2d1283c19a7e3213485b74a591
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_065a41d620c99af98ccc27a65358b58e |
| publicationDate |
2002-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1239278-A8 |
| titleOfInvention |
Method and device for assessing striae in optical materials |
| abstract |
The method and device for evaluating streaks in glass-like or crystalline optical materials comprises irradiating a sample (14) of the material to be tested with light and producing a real silhouette of the sample (14) on a projection screen (16), the silhouette the sample (14) is recorded on the projection screen (16) by an electronic image recording device (18) with a downstream image processing device and compared with the silhouette of streaks in a sample sample (40) measured by interferometry, and the streak in the sample being based on the comparison result (14) of the optical material. |
| priorityDate |
2001-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |