Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2dff902f580792a5b5b5e40f1e29bfd6 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31905 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 |
filingDate |
2000-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc69b729f9ca897567a0638c4b395e74 |
publicationDate |
2002-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-1190322-A2 |
titleOfInvention |
Semiconductor parallel tester |
abstract |
A semiconductor parallel tester is disclosed for simultaneously testing a plurality of DUTs secured to a handling apparatus. The test system includes a system controller for initiating system test signals and a pin electronics assembly responsive to the system test signals to generate test pattern signals for application to the plurality of DUTs. The system further includes a signal interface defining a plurality of direct signal paths between the handling apparatus and the pin electronics assembly. |
priorityDate |
1999-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |