http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1154275-A2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_194c71bd36ed36441ad527ba633f28fc |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0408 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate | 2001-05-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5ca20605d5886786a1b5ba8986c9fb0f |
| publicationDate | 2001-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-1154275-A2 |
| titleOfInvention | Bga on-board tester |
| abstract | An on-board tester (referred to as a "test fixture") for testing integrated circuit chips,nparticularly ball grid array (BGA) chips. The test fixture of the present invention eliminates manynof the problems associated with presently available test fixtures, particularly the lack of control innmounting the chips to the test fixture, and the unpredictable testing results. The present test fixturenhas an upper assembly and a lower assembly. A circuit board containing the BGA chip to be testednis mounted between the upper and lower assemblies. The lower assembly has guide pins extendingntoward the upper assembly which allows any circuit board having alignment holes that match thenconfiguration of the guide pins to be mounted to the lower assembly. Moreover, the present testnfixture has a unique latching mechanism which uses rotational movement to latch and unlatch thentest fixture. Particularly, a collet assembly is used which allows rotation of a shaft to compress othernplates in the assembly so that the upper and lower assembly are properly secured together.nRotational movement is also used to secure the test pins of the test fixture to the BGA chip. The testnfixture has a knob that is rotated to linearly draw the upper and lower assemblies together until thenprobe test pins have an effective electrical connection with the BGA chip. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106019016-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106019016-A |
| priorityDate | 2000-05-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.