| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_80787665b837ed3eb503bbcd27c0043a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0049 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0009
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F23G5-50 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/F23G5-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62 |
| filingDate |
2000-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_85143ee1b221fdd3dde1d8aef7a9d90d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_79a5bcbf2bc1b2a7e1e97d08141ddec9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5ce4b96df85c972543b5981b8288dce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24ec4e067c5c3f1edb3ecd0067b26774
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59b4e106ae1783b3842870d7bd091721
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_613310ede89b8225721464c0b51a8634 |
| publicationDate |
2001-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1102004-A1 |
| titleOfInvention |
Sample analyzing monitor and combustion control system using the same |
| abstract |
The concentration of a target trace gas which has an ionization efficiency changed by the effect of impurities and which is absorbed on a pretreatment portion or piping (4) is measured mass spectrometrically, at a high accuracy and in real time, by adding an internal standard having a known concentration to the target trace gas. The internal standard has substantially the same properties (such as ionization efficiency change and vapor pressure) as the target trace gas. The ion strengths of the target trace gas and the internal standard are compared to calibrate the concentration of the target trace gas. Thus the concentration of the target trace gas in gas containing impurities can be measured online in real time and at high accuracy while being continuously calibrated. <IMAGE> |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1476893-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1476893-A4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7968055-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8054082-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1394537-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2107594-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1394537-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2107594-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-2910966-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2008080987-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-02101376-A1 |
| priorityDate |
1999-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |