http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1096321-A1

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filingDate 2000-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f5c2ae25faa4cf85fb8704d816dae3ed
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publicationDate 2001-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1096321-A1
titleOfInvention Light exposure method
abstract A light exposure method for ultra-fine processing for a semiconductor in whichnlight transmittance of a resist layer in a wavelength range of the extreme ultravioletn(EUV) light is improved to enable ultra-fine processing more elaborate than is possiblenwith conventional methods. In selectively exposing a resist layer to X-rays, a highnmolecular materials obtained on replacing at least a portion of hydrogen atoms of anpre-existing resist material by a substituent containing an alkyl group and/or ansubstituent containing an aromatic ring is used as a high molecular material of thenresist layer. By replacing the hydrogen atoms of the high molecular materials with ansubstituent containing an alkyl group or a substituent containing an aromatic ring, thenproportion of oxygen atoms in an atom of the high molecular materials becomesnrelatively smaller to suppress optical absorption of the entire high molecular material.
priorityDate 1999-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.