| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b6f326dbe8d21e63e6bdd68850d00619 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-03
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-0214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-0207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-0242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-0278 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-958
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02C13-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-30 |
| filingDate |
1998-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c57f595fa0faa6f6a0bd3c393d5706eb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_74c0371b9ae00735a1aa21638914ab1e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a91656abe644e33e1918b998aa398e8d |
| publicationDate |
2000-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1032812-A2 |
| titleOfInvention |
Automatic lens inspection system |
| abstract |
An automatic system for inspecting contact lenses (15) that are suspended in a saline solution (17) within a lens holder. In the manufacturing process a first electronic image is taken of each lens disposed in its holder. Thereafter a second image is taken of the lens after the holder has been rotated and the solution and lens have moved. The two images are compared and any dark spots on the first image that move with respect to the second image are eliminated as artifacts that are caused by contaminants in the solution or marks on the lens holder. The rim of the lens, optical zone, printed logo and colored iris area of the lens are automatically inspected by a computer program for defects. The lens is rejected if defect features are found in any of the inspected areas. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2021124101-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11585723-B2 |
| priorityDate |
1997-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |