| abstract |
A semiconductor sealing epoxy resin containing an epoxy resin, a phenol resin, a curing accelerator and an inorganic filler, which has the following properties, (X) to (Z): (X) 50 to 500 poise in terms of a viscosity at 175 °C, as measured using a flow tester, (Y) 1 x 105 poise or less in terms of the minimum melt viscosity, in a temperature distribution of viscosity, as measured at a shear rate of 5 (1/s) by means of a dynamic viscoelasticity measuring apparatus, and (Z) 2.0 or more in terms of a viscosity ratio (Z1/Z2) of a viscosity at 90 °C (Z1) to a viscosity at 110 °C (Z2), as measured at a shear rate of 5 (1/s) by means of a dynamic viscoelasticity-measuring apparatus. The semiconductor sealing epoxy resin is free from the occurrence of shift of the position of a semiconductor element by flow of a resin during sealing and of tilt of a chip by metal wire run or the like, and can be used for providing a semiconductor device exhibiting high reliability. |