| abstract |
An organic light emitting device (100, 110, 120) having a processncompatible current self-limiting (CSL) structure (105, 115, 125) applied innthe vicinity of an electrode (102, 112, 122, 108, 118, 128) of the devicenprevents the occurrence of high current flow in the vicinity of a short (134)nwithin the device. Should a short (134) occur, the CSL structure (105, 115,n125) becomes resistive, or non-conducting in the vicinity of the short (134),nthus preventing the occurrence of "runaway" current in the vicinity of thenshort (134). By limiting the current flow between conductors in the device,nthe non-emissive areas of the device can be minimized, thus improving thenoverall reliability of the device. |