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filingDate 1998-05-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3eb6dae060afad3ad23eaf795adcf48c
publicationDate 2000-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0980520-A1
titleOfInvention Process and circuitry for inspecting welding points
abstract In a process and apparatus for inspecting welding points (or solder joints) for defects by means of X-rays, before the welding points are inspected, the values of predeterminable measurement parameters, such as height of a welding meniscus or rise of a grey scale value curve generated by the device, are determined for reference welding points. When the welding points are subsequently inspected, selected measurement parameters are evaluated.
priorityDate 1997-05-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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