http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0860880-A2

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3a62c92e56568bd104089aac22ca487b
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-12044
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-3142
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5329
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5222
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-312
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-532
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-522
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-31
filingDate 1996-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b61cbbfebd0f206a116319ec3841228
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f01b89a691ebded8017f297a882081fc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_97b22a44542905014bf649b2d9a83c11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f395250da28dead80c07d80cbdbe77be
publicationDate 1998-08-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0860880-A2
titleOfInvention Semiconductor device having improved interconnection pattern and method of manufacturing same
abstract A semiconductor device is described having an interconnection pattern comprising andielectric layer (21) bonded to a metal layer (22) through an intermediate bondingnlayer (23) formed by reaction of an adhesion promoter with the metal. The dielectricnlayer comprises a material selected from the group consisting of teflons, parylenes andnsilesquioxanes. By employing a low resistivity metal, such as copper and a lowndielectric constant material a low RC delay interconnection pattern can be formed.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6864170-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10059935-A1
priorityDate 1995-09-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5194928-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0618617-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5115090-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5153986-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5196103-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID104727
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557109
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6327157
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23954
http://rdf.ncbi.nlm.nih.gov/pubchem/taxonomy/TAXID434418
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419583196
http://rdf.ncbi.nlm.nih.gov/pubchem/anatomy/ANATOMYID434418
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID426098968
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419545509
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689

Total number of triples: 44.