http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0845103-A1

Outgoing Links

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filingDate 1996-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_69483187ed913862ec7c27554f9a1939
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_17b6f2c1f28684b72a07c254ec47870b
publicationDate 1998-06-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0845103-A1
titleOfInvention Improved diffuse reflectance monitoring apparatus
abstract An improved apparatus for diffuse reflectance spectroscopy having a specular control device. The specular control device has at least a first surface divided into an even-numbered plurality of reflecting sections (112, 114) and open or transmitting sections (116, 118). The number of reflecting sections is equal to the number of open sections. Each reflecting section is situated between a pair of open sections and opposite to another reflecting section. Similarly, each open section is situated between a pair of reflecting sections and is opposite to another open section. In one preferred embodiment, the total surface area of the reflecting sections is equal to the total surface area of the open sections. In another embodiment, the total surface area of the reflecting sections is unequal to the total surface area of the open sections. In another preferred embodiment, opaque spacers (111, 113) are provided on the borders between adjacent sections to improve the detecting definition between source and reflected beams, and to selectively provide (115, 117) for decreasing surface area of one or more selected sections.
priorityDate 1995-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 24.