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filingDate 1997-08-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 1998-04-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0827159-A3
titleOfInvention Epoxy resin composition and semiconductor device encupsulated therewith
abstract In an epoxy resin composition comprising an epoxynresin, a curing agent, and 80-90 wt% of a particulateninorganic filler, fine particles having a particle size ofnless than 3 µm account for 10-40 wt% of the inorganicnfiller, and the inorganic filler has a specific surface areanof less than 2.5 m 2 /g as measured by a nitrogen adsorptionnBET method. The inorganic filler satisfies that when anblend of a bisphenol F type liquid epoxy resin having anviscosity of 30-45 poises at 25°C as measured by Gardner-Holdtnmethod with 75 wt% of the inorganic filler is measurednfor viscosity at 25°C by means of an E type viscometer, thenviscosity at a shear rate of 0.6 s -1 is less than 50,000npoises and the ratio of the viscosity at a shear rate of 0.6ns -1 to the viscosity at a share rate of 10 s -1 is less thann2.5/1. The epoxy resin composition has a low melt viscositynenough to mold on semiconductor devices without die pad andnwire deformation.
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