http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0793807-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_26e69ef7b7bc98bfe778e419ccd664c9
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K13-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 1995-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a02c3a33541aba4e831d7d2afb129bed
publicationDate 1997-09-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0793807-A1
titleOfInvention Method and device for testing of electronic components
abstract A test assembly for use in testing electronic components, preferably surface mount IC-circuit components, includes a carrier (4) by means of which a component (2) is picked-up and brought to and held against the conductors (6) on a printed circuit board (5). The printed circuit board (5) includes at least one cavity (9) underneath the contact conductors (6) in the region where the component (2) is to be held, such as to render the conductors resilient. Pressure pads (7) are placed in the cavity (9) between the bottom of the cavity and the contact conductors (6) such as to regulate the resilience of the conductors (6).
priorityDate 1994-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3516
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419505727

Total number of triples: 18.