http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0779507-A1

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filingDate 1996-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6f3d574586e6628eca8785c6c6c95d99
publicationDate 1997-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0779507-A1
titleOfInvention A method for determining the concentration of a specific gas and an analyzer
abstract A method and an analyzer (2) for determining the concentration of and/or identifying a specific gas are described. The analyzer (2) comprises a test chamber (4) through which a gas sample is carried (10). The gas sample then passes across a first substrate (6) on which a first coating (8) and a second coating (10) are arranged. The second coating (10) is made of a substance which selectively adsorbs a specific gas, or a specific group of gases. A light source (14) directs a light beam (16) with a pre-defined polarization at the substrate (6) and coatings (8, 10). Polarization of the ensuing reflected light beam (18) changes due to reflection in and interaction with the coatings (8, 10). This change is determined by a calculation unit (22) by determining the reflected light beam's (18) polarization in a photodetector (20). Adsorption causes polarization changes which are only related to the concentration of the specific gas which can accordingly be identified.
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priorityDate 1995-12-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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