| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a2e5bbf1b6aa237a2849359b06c9f350
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_46ffc67cd29dd51dbd0bc0e335dd3994 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-21
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-117497
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-359
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-115831
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-218
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-216
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-212 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C10G9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-2829 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C10G9-00 |
| filingDate |
1995-10-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1999-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_95ab8c13ef11677310a2a434f3c0c41e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eebdeb0875d07c6d6db3bb4fb211f073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7bdcaaf18e1982614f250234ed734060
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c019809e0744c79bd8e3950fba39b900
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7465fd18a75efcdc8be0a3455f0bacd0 |
| publicationDate |
1999-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0742901-B1 |
| titleOfInvention |
Cracking property determination |
| abstract |
A method of determining or predicting a value Px of a property of a feed X to a steam cracking process or yield of said process, which method comprises measuring the absorption Dix of said material at more than one wavelength in the region 600-2600 nm, comparing the said absorptions or a derivative thereof with absorptions Dim or derivatives thereof at the same wavelength for a number of standards S in a bank for which the said property or yield P is known, and choosing from the bank at least one standard Sm with property Pm said standard having the smallest average value of the absolute difference at each wavelength i between the absorption Dix (or derivative thereof) for the material and the absorption Dim (or derivative thereof) for the standard Sm to obtain Px, with averaging of said properties or yields Pm when more than one standard Sm is chosen. |
| priorityDate |
1994-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |