http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0740336-A2

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filingDate 1996-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 1996-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0740336-A2
titleOfInvention Method for fabricating semiconductor device having buried contact structure
abstract A method of forming a tungsten plug is disclosed in which a blanket tungsten layer 16 is deposited on a conductive layer including a titanium nitride film 15 and thereafter etched back by using SF 6 plasma until the surface of the titanium nitride (TiN) film 15 is exposed. At this time, fluorine in SF 6 adheres to the surface of the TiN film. The wafer thus treated is kept into a vacuum atmosphere and then a removing step is performed to remove fluorine from the surface of the TiN film.
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