http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0687380-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_daa48ed820a7dad29affa51e58caf757 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-20285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-26 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-20 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-20 |
| filingDate | 1994-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3369ecbdd10dd4fc5088c796355ecd4d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_85f98e76a0af0a8e3106827b47d0eecf http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e2e5763f7571cc2b56227619b4d9bfb2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1cf2992470ace5bfa277f6bbf041134c |
| publicationDate | 1995-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-0687380-A1 |
| titleOfInvention | Electron microscope having a goniometer controlled from the image frame of reference |
| abstract | A separate user frame of reference is provided for the operator of an electron beam microscope to use in generating position and tilt commands for a motorized goniometer, rather than requiring that the operator input position and tilt commands to the motorized goniometer in the same frame of reference used by the goniometer to implement position and tilt changes. The electron beam image observed by the operator on a display screen furthermore forms the separate user frame of reference in order to make control of the specimen by the operator intuitive. Since the operator observes the user frame of reference and generates position and orientation commands in the user frame of reference, navigation around the sample is easy to accomplish, even for a novice operator. The image does not inadvertently rotate when other specimen movements are intended and an unintented modification in position along the beam axis does not occur for the imaged portion of the specimen unless the operator inputs such a modification. |
| priorityDate | 1994-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 22.