http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0618438-A1
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4ddcb273a108a5d8472b335280098e06 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-274 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 |
filingDate | 1994-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89e68d965b71d631f8b36bddac28e931 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e34c6afa057dedcd307016d24ef4b8f |
publicationDate | 1994-10-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | EP-0618438-A1 |
titleOfInvention | Procedure for calibrating a measuring device, in particular an infrared absorption photometer |
abstract | It is known to linearize the characteristic curve of absorption photometers by means of a higher order function. According to the present invention, the two mutually influencing device-specific parameters, gain and sag factor of the higher order function are obtained by recording two test signals with two test gases. Setpoints are formed from the known concentrations of the test gas components to be measured. Using an iterative process, the gain factor is approximated on the basis of the difference between the calculated output signal and the desired value and the associated sag factor is determined.n n n The invention is mainly applied to single-beam IR absorption photometers. |
priorityDate | 1993-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.