| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0569c16f4e914d25129a8480a1fb3682 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-117497
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-17 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-2025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0011
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0006 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-20 |
| filingDate |
1992-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f8fbe75a4d576848493bfd4903c97c31 |
| publicationDate |
1993-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0563447-A1 |
| titleOfInvention |
Method for determining the concentration of a gas in a molten metal |
| abstract |
The invention relates to a method for determining the concentration of a gas in a molten metal by means of a carrier gas, which can be supplied to at least one analyzer either for calibration directly or for measurement via a measuring circuit with a measuring probe immersed in the molten metal, the carrier gas for Measurement with the molten metal enters a gas exchange and this gas mixture is fed to the analyzer. In order to determine the concentration of a gas in a molten metal at a high speed and very precisely, the carrier gas is fed in one section for one measuring cycle both directly to the analyzer for calibration and to the measuring circuit for purging and for taking up the gas to be measured in such a way that the gas to be measured is available at the analyzer, that the carrier gas is then at least partially fed to the at least one analyzer via the measuring circuit and that a partial pressure is calculated as a first approximation for the partial pressure of the gas to be measured in the molten metal after the gas exchange with the molten metal. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2775285-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2015049-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102007032436-B4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102007032436-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8844386-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8104325-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8671735-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102007063673-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102007063673-B4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-9724464-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-101344465-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-101344465-A |
| priorityDate |
1992-04-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |