| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fc96f7ca6231e48831991c44eecf0341 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10144
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30112
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10116 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-083
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01V5-005
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01V5-0041 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01V5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-50 |
| filingDate |
1991-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f88037501ea2c63a5d025d02182e6819
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_622d50f96b7cfd81b5edcd68bb96c017
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a29f79886b721f521f3b1bce698c27e |
| publicationDate |
1993-05-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0542911-A1 |
| titleOfInvention |
Device and method for inspection of baggage and other objects |
| abstract |
Device and method for detecting a specific material (23) superimposed on an unknown background when the locations of the specific material (23) and the bottom are unknown, for example inside a baggage (4). Said invention consists in exposing an area of an article to be inspected to X-rays (2) of two substantially different energies, to effectively use differences, specific to the materials, characteristic of the diffusion of the photoelectric effect and of the Compton scattering (232) and comparing (32, 132) the pairwise differential attenuation of X-rays in nearby exposed subzones (19, 21) to determine whether these differences (230) in attenuation can be attributed to the presence of different quantities of the specific material (23) superimposed on the respective sub-areas (238). The most likely sub-areas (570) are indicated (40, 140) on a standard image appearing on a screen (9) as being the most likely location of the specific superimposed material (240). |
| priorityDate |
1990-08-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |