http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0408062-A2

Outgoing Links

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3105
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-08
filingDate 1990-07-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7f1980f5bb7fa75d8849513a4f50f9e8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_93a0a146b6350a180dcd4a173211fa5d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_93fb0d8cac22868b7f2e05fdf1d8172f
publicationDate 1991-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0408062-A2
titleOfInvention Surface treatment method and apparatus therefor
abstract A method of preventing damages of a semiconductor having an insulator film at its surface caused by holes induced in the insulator film and move to and are trapped at or near the interface between the insulator film and a substrate upon applying surface treatment for the surface of the semiconductor, as well as an apparatus suitable to practicing the method are disclosed. The surface treatment method comprises trapping to eliminate the holes in the insulator film by an electric field before the movement of the holes at or near the interface, neutralizing the induced holes by re-combination, or previously forming a hole trapping level in the insulator film thereby trapping the induced holes to the trapping level.
priorityDate 1989-07-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.