http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0317770-A1

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filingDate 1988-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a98830a865623a3c7c7fa1db56e07fb6
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publicationDate 1989-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0317770-A1
titleOfInvention Self aligned planar metal interconnection for a VLSI device
abstract A method of interconnecting metal layers in integrated circuits separated by an intermediate dielectric layer by forming first (12,14) and pillar (16,18) layers of metal, etching the pillar layer to form a pillar of electrically conducting material and etching the first level (12,14) to form the first level lead having at least two sides vertically aligned with the pillar (16,18). A layer of dielectric (36) is applied to cover the pillar and first level lead. a layer of photoresist is deposited over the dielectric with a spin on technique to form a planar surface. The dielectric and photoresist are etched back with an equal etch rate until top portion of the pillar is exposed. A second level lead (42,44) is formed atop the pillar (16,18) and planar top surface of the dielectric.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0405848-A3
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priorityDate 1987-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 28.