http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0312580-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d9f3ca41550d315642580237250c5b0 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-89 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G07C3-14 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-89 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G07C3-14 |
| filingDate | 1988-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7a68c771b89e6c81812f6d765ad0dfdb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_56311eba68f8b843dab87c22960fc28b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_898dce99f1a7fd115aed56093b68c08c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59c8dd0467c34234a314a8d5da05342f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f02090f245f2c5164278b58aa49d00ea |
| publicationDate | 1989-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-0312580-A1 |
| titleOfInvention | SYSTEM FOR MONITORING AND ANALYZING A CONTINUOUS PROCESS. |
| abstract | A continuous process, including quality control of the production of paper webs, is continuously monitored and analyzed with high resolution in order to detect defects, despite the fact that the signal processing necessary for such monitoring and maintenance. such high resolution analysis requires processing data at enormous rates (eg billions of calculations per second). The system uses a computer architecture for continuous data processing in real time. At a first level of the architecture, the signals received from the process (by the scanning of successive lines on the paper) are digitized and reduced so as to represent data corresponding to certain events, such as tape defects. At a second level of the architecture, a row of parallel processes simultaneously and continuously process the reduced data to provide outputs that characterize events, for example, measurements regarding the location and extent of tape defects. At a third level, the data from the second level is analyzed to provide outputs that represent the analysis of the process faults represented by the events. These outputs are used to control the process or to give information about the source of the defects, thus ensuring the production of an exclusively high quality material. |
| priorityDate | 1987-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.