| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d5ebd9bdc11f7a4b267d7e865d5a84f |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-861
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-868 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q10-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q10-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q10-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q30-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-16 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N37-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q10-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B7-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-00 |
| filingDate |
1988-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_070522be0f7172cfe8644c364def421b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4dce4cbeea3e2bac68b2118099123a8f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2a62e77264b4f93ac05339a5037016b6 |
| publicationDate |
1988-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0296871-A2 |
| titleOfInvention |
Tunnelling scanning microscope |
| abstract |
A tunnelling scanning microscope comprising a probe (8) having a fine conductive tip; means (6,7) for positioning the tip of said probe (8) sufficiently close to a surface of a sample (5) to be investigated so that tunnelling current flows; means (13) for scanning across said sample surface with the tip of said probe (8); means (14) for automatically controlling the distance between the tip of said probe (8) and said sample surface during scanning in response to measured tunnel current; and display means for producing an image of the configuration of the sample surface characterised in that a light source (9) is provided for irradiating the sample surface. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0391040-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0391040-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6127681-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0441311-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0441311-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5508517-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0640829-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0640829-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5144128-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0401852-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0401852-A3 |
| priorityDate |
1987-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |