http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0271508-A1

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filingDate 1987-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed138b3182876c319077a447f598814a
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publicationDate 1988-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0271508-A1
titleOfInvention TESTING PHOTODIODS WITH ELECTRON BEAMS.
abstract Method and device for testing arrays of photodiodes using an electron beam. The diodes are charged at successive intervals following the RC time constant curve to develop voltages gradually increasing at the end of the successive time intervals. The voltage and current of the diode are measured at the end of each interval and the resulting data is used to develop a current-voltage characteristic for each diode.
priorityDate 1986-06-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 29.