| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-0055
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-0052
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-161
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-0228 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-0269
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-91 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-91 |
| filingDate |
1982-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1985-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
1985-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0071872-B1 |
| titleOfInvention |
Method of detecting and analyzing flaws in a printed circuit board laminate |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0244259-A1 |
| priorityDate |
1981-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |