http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0032108-A2

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filingDate 1980-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b6ca7d2e1cd188f1bb8440863e9ed51
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publicationDate 1981-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-0032108-A2
titleOfInvention Apparatus for X-ray absorption fine structure spectroscopy
abstract Apparatus (10) for obtaining EXAFS data of a material (11). A lens (12) directs a pulse of radiant energy (13) from a laser (14) onto a metal target (15) to produce X-rays (16) of a selected spectrum and intensity at the target (15). A baffle (17) directs X-rays (16) from the target (15) onto a spectral dispersive monochromator (18) which directs the spectrally resolved X-rays (16R) therefrom onto a photographic film 20. A film of material (11) is located in the path (22) of only a portion (16L) of the X-rays (16) throughout a selected spectral band, and the resolved X-rays (16R) directed onto the photographic film (20) form two separate images thereon comprising a reference spectrum (26R) representative of a portion of the X-rays (16U) throughout the selected band that was not affected by the film of material (11) and an absorption spectrum (26A) representative of a portion of the X-rays (16L) throughout the selected band that was modified by transmission through the film of material (11). The laser pulse (13) typically has a width of less than about 10 nanoseconds, and the material (11) may be in a highly transient state.
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priorityDate 1979-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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