patent/DE-69636701-T2

http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-69636701-T2

Outgoing Links

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filingDate	1996-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate	2007-09-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor	http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cab3435cb807e6f0a2197ef962979524 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c57f819f0db1c9d62325fac624278521 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0186547c4b068f1c77ea2957e65ec00a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_91795691f0b1ec1627431890dbe3b2e9
publicationDate	2007-09-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber	DE-69636701-T2
titleOfInvention	Method and device for testing semiconductor chips
priorityDate	1995-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type	http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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isDiscussedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541

Total number of triples: 87.