http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-2930805-A1

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filingDate 1979-07-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4c5685be41d776042278b738285ccacd
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publicationDate 1981-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-2930805-A1
titleOfInvention ADDITIONAL DEVICE FOR MICROSCOPE, ESPECIALLY FOR GRID ELECTRON MICROSCOPE
abstract The attachment allows analysis of the stresses within the specimen while simultaneously subjected to a tensile or compressive force. It uses two clamps for the specimen, movable relative to one another in the direction of the force. The overall force applying system is supported by a slide carriage to allow it to move to an fro in the direction of the force along a longitudinal slide rail rigidly attached to the microscope. Pref. the force applying system is also movable transversely relative to the direction of the force via a cross carriage moving along a rail defined in the top of the first slide carriage.
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Total number of triples: 34.