http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-2831494-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3070783318d4f17db6ad97e418a5503 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3336 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-333 |
| filingDate | 1978-07-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ea0c9c1cf744995b5dcbac6cf0b177a7 |
| publicationDate | 1980-01-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-2831494-A1 |
| titleOfInvention | SYNTHETIC TEST CIRCUIT FOR MEDIUM AND HIGH VOLTAGE SEMICONDUCTOR SWITCHES |
| abstract | The artificial test circuit is for medium and high voltage semiconductor switches and enables periodic testing using a low voltage switch current circuit and a high voltage switch blocking voltage circuit. This enables testing to be conducted on blocking characteristics with a fraction of the cost of equipment and power consumption of conventional circuits. A high voltage oscillator circuit loss compensating recharging circuit consists of a series circuit contg. a recharging transformer secondary, a choke, an alternating path thyristor pair, and a capacitor. The high voltage oscillator is connected in series with the capacitor. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-19930993-A1 |
| priorityDate | 1978-07-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419547315 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7871 |
Total number of triples: 14.