http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-2631783-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2637 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1976-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1978-07-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-2631783-B2 |
| titleOfInvention | Measuring method for the analysis of traps in semiconductor materials |
| priorityDate | 1976-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID118701720 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID448702418 |
Total number of triples: 10.