| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e86afcb9962e3512083c29b5de7f6d7c |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2831
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2637 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
1972-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49ea91d149859434101ea4f280f01440 |
| publicationDate |
1973-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-2220339-A1 |
| titleOfInvention |
METHOD AND DEVICE FOR THE EXAMINATION OF DOPED SEMICONDUCTOR MATERIAL |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-2521909-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-3103611-A1 |
| priorityDate |
1972-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |