| abstract |
The device for producing nanoscale metal objects, comprising a stage and a measuring head of the scanning probe microscope, which consists of a spring beam a source of electrical influence on the system: cantilever / pattern, piezo scanner, equipped with a compensator of thermal deformation and temperature drift, a A vibration damping device, a digital electronic system for controlling the sensing head of the scanning probe microscope, characterized in that the cantilever tip is made of a solid electrolyte, which provides for metal ion migration. |