http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-19962702-B4

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filingDate 1999-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2008-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d310ffcc671c4306432ac8e3d7979cd0
publicationDate 2008-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-19962702-B4
titleOfInvention Test socket of a BGA device
abstract Test socket with a contact element block (10, 30, 40), the is provided with a plurality of passage openings (12, 123, 131b), - Wherein an inclined surface (11 a, 122 a, 131 a) is provided in an upper region of each through hole (12, 123, 131 b), and - wherein the inclined surfaces (11a, 122a, 131a) of the through holes (12, 123, 131b) for applying a uniform pressing force to the respective surface of a plurality of solder balls (1a) of a ball grid array device (1) are formed when the ball grid array device (1 ) is brought into contact with the contact element block (10, 30, 40) under a pressing force, and a housing (20, 110) provided with a contact element block recess (21) for mounting the contact element block (10, 30, 40) and a holding section (22, 23, 111a, 111b, 221, 222) for receiving the ball grid array device (1), characterized in that the inclined surfaces of the through-hole (12, 123, 131b) and the inner surface of the through-hole (12, 123, 131b) are provided with a ...
priorityDate 1998-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 28.