| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_884dd6d378ed5561ea1373862adfb5a3 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2656
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate |
1999-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2002-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_585c2882b360707c2e954095fdc2b8e7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f74116e05dc03796ae2479156361e360
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_02144ee790670d2178e6dd2e1809e378
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b1bee24d5c7acdb0f521bfaeed98799
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d459803988da948cd2a92faafe492b5b |
| publicationDate |
2002-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-19915051-C2 |
| titleOfInvention |
Method and device for the spatially resolved characterization of electronic properties of semiconductor materials |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102008013068-B4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102008013068-A1 |
| priorityDate |
1999-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |