http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-19713986-B4
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d527f9a5c3e991a1797de3518a88d14 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31912 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K19-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2887 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31907 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2867 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2834 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01V8-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01V8-12 |
| filingDate | 1997-04-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2005-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c471f00aa28c7d9832d7f8e8b7f14071 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2c06dddb3ec01eae1672486bec523db6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_de0b2d6bb80304c3d77de685532f64fe http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a733a88b251884d8b7e262f720be876d |
| publicationDate | 2005-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-19713986-B4 |
| titleOfInvention | Semiconductor device tester |
| abstract | A semiconductor device test apparatus having a test section and a handling section, in which semiconductor devices to be tested are transported in a feed section (300) of the handling section to and from a test tray (TST1, TST2) stopped at the feed section (300) of the handling section the test tray for testing the semiconductor devices is transported from the loading section (300) to a test area of the handling section, the test tray having the tested semiconductor devices mounted thereon, after completion of the test, from the test area to a discharge section (FIG. 400) of the handling section, where the tested semiconductor device (18) located on the test tablet is moved from the test tablet to a general-use tray, and the test tray emptied from tested semiconductor devices the discharge section (40 0) is transported to the loading section (300), repeating the above operation, wherein the semiconductor device test device is characterized that on the course of the transport path of the test tray between the discharge section (400) and the ... |
| priorityDate | 1996-04-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID450839641 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID135487615 |
Total number of triples: 27.