| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9fc0a00eab3a757e8324b1e887d7ba97 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-87
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-873 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y35-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K7-04 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-311
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-308
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K7-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B9-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K7-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N13-00 |
| filingDate |
1996-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7b6560743981d0b0417bee54e33b0cc8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d547d62ecdf6441881dd85be0248d17e |
| publicationDate |
1997-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-19636232-A1 |
| titleOfInvention |
Sensor for generating surface images and process for its production |
| abstract |
The measurement probe (10) has a first material strip (11) with at least one section forming a first flat reflective surface. A second material strip (12) forms a thermoelement connection point (13) with the first strip. A measurement sensor tip (15) lies under at least part of the thermoelement connection point. The measurement sensor tip is formed by a thermally conducting and electrically insulating material, selected from the group containing diamond, hydrocarbons and silicon nitride. The two material bands have a width and a thickness each ranging from approximately 25 to 500 microns. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9958338-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102011054803-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102011054803-B4 |
| priorityDate |
1995-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |