| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_65abfdebeafb864f075623f59a6d9443
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5a604c9c3c3ce59e6dfbea6e253bcf65 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01H2033-567 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-622
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01H33-56 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01H33-56 |
| filingDate |
1995-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1997-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_66634cd2c413b5b37d78c33b17c939b1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fbb4e21344a24f1dbb7a0e92c5e937fe
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41041764df045716a61abd9fc74e7d30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f6c5f60ffd3bf71bed074445d6472977
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c1fc27b7b9d0cb934b86f325d727ec3b |
| publicationDate |
1997-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-19528290-C1 |
| titleOfInvention |
Procedure for monitoring the quality of the filling gas sulfur hexafluoride in gas-filled systems |
| abstract |
The invention concerns a method of monitoring the quality of filler gases, in particular sulphur hexafluoride (SF6), in gas-filled installations, in particular gas-insulated switchgear such as high- and medium-voltage switches. The aim of the invention is to propose a method which makes continuous monitoring of filler-gas quality possible, at the same time making it possible to locate any fault and determine the type of fault in the installation. This is achieved by virtue of the fact that the filler gas is continuously exchanged, at least for the time taken to carry out the analysis, between the installation and an ion-mobility spectrometer in which the filler gas is ionized and the ions thus formed are analysed in the drift channel of the spectrometer. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012100827-A1 |
| priorityDate |
1995-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |