| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09C1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F21-73
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-57
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L9-0866
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F7-588 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-58 |
| filingDate |
2013-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c539cdc4e52be2e966028227aeed4a42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e5178bd4667402ee0c55dcc5588bc53d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b81fe58b9af0f4a368b5fb8c88e7a3b5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_35d70f8d29004be9b1970f72ab764fcc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2659824efd3aa9bbe803134c69607d85 |
| publicationDate |
2015-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-112013003530-T5 |
| titleOfInvention |
Reliable, physically nonclonable function for the authorization check of a unit |
| abstract |
The present disclosure relates to a secure unit having a physically non-clonable function and to methods of manufacturing such a secure unit. The unit includes a substrate and at least one high-k / metal gate unit formed on the substrate. The at least one high-k / metal gate unit represents the physically non-clonable function. In some cases, the at least one high-k / metal gate unit may be subjected to variability enhancement. In some cases, the secure unit may include a measuring circuit for measuring a property of the at least one high-k / metal gate unit. |
| priorityDate |
2012-08-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |