| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_421cadb30fc0074fe61126eb980d19d6 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-063
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-06341
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-06316 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J1-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C25F3-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J9-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J9-025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J9-042
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-285
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J1-3044
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J1-16 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J9-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J1-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J1-16 |
| filingDate |
2012-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_14e80f7ee3f4398f99f0ee6ad45ef691
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_83a7282b8c8db3924ea261d3ae58fba7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cd5152c8dccec0cc3938310cf92de591
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f83cebc71bea3387030b36eb7bb2ae01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f29c4a07be3a4be8aa3a48a52d7ca454 |
| publicationDate |
2015-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-112012006916-T5 |
| titleOfInvention |
Method for producing an electron source |
| abstract |
Conventional methods of machining a tip can not determine the dimension of the shape of the end of the tip and therefore can not obtain a tip of a desired diameter. It can attach impurities to the tip. Based on a correlation between the applied voltage or the time of processing the tip end and the tip end diameter, the applied voltage is controlled to obtain a desired tip end diameter when processing the tip. This makes it possible to produce a sharpened tip of a thin tungsten monocrystal wire having a desired diameter in the range of 0.1 μm or more and 2.0 μm or less. |
| priorityDate |
2012-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |