http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-112010003900-T5

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_696ca0ae93d5cf5a686273601361781f
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09K13-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-30608
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-308
filingDate 2010-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d57412aec682efd233c246c3359e64d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_419f939570a9f21722b3ffb3d609539a
publicationDate 2012-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-112010003900-T5
titleOfInvention Solution for etching silicon and etching process
abstract An etch solution is provided which realizes a high etch rate when processing silicon by etching, particularly in an anisotropic etching process of silicon in a manufacturing process of semiconductors or MEMS parts. containing etching solution, and causing the decrease of the Si etching rate to decrease when Cu is in the solution, and an etching process. The etching solution is a solution for etching silicon, which is an alkaline aqueous solution containing an alkaline hydroxide, hydroxylamine and a thiourea and which is characterized by anisotropic dissolution of monocrystalline silicon, and the etching method is an etching method of Silicon using the etching solution.
priorityDate 2009-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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