Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823437 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66545 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-30604 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823437 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0673 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42392 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8234 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 |
filingDate |
2020-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f2ffdd1f39723253650c341e69c64334 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6d3f5cd1d968a1312c678253f85734b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e515380dcc946d7d3a0d3ae13ad4ac33 |
publicationDate |
2021-06-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
DE-102020115785-A1 |
titleOfInvention |
SEMICONDUCTOR STRUCTURE AND PROCESS FOR THEIR PRODUCTION |
abstract |
A semiconductor structure is provided. The semiconductor structure has a first gate-all-around field effect transistor (GAA-FET) over a substrate, the first GAA-FET having first nanostructures and a first gate stack that encloses the first nanostructures. The semiconductor structure also includes a first fin field effect transistor (FinFET) adjacent to the first GAA-FET and having a first fin structure and a second gate stack over the first fin structure. The semiconductor structure also has a gate cutting element which is arranged between the first gate stack of the first GAA-FET and the second gate stack of the first FinFET. |
priorityDate |
2019-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |