http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102020109110-A1

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filingDate 2020-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6e347443bca556e78393fc0783f1f422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_08d5ae3f576bfc3f0fffb4ee8311e75f
publicationDate 2020-12-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-102020109110-A1
titleOfInvention HIGH VOLTAGE TOLERANT CIRCUIT ARCHITECTURE FOR APPLICATIONS SUBJECT TO ELECTRIC OVERLOAD FAULT CONDITIONS
abstract A semiconductor die with a high voltage tolerant electrical overload circuit architecture is disclosed. One embodiment of the semiconductor die includes a signal pad, a ground pad, a core circuit electrically connected to the signal pad, and a stacked thyristor protection device. The stacked thyristor comprises a first thyristor and a resistive thyristor electrically coupled in a stack between the signal pad and the ground pad, which improves the withstand voltage of the circuit relative to an implementation with only the thyristor. Furthermore, the ohmic thyristor has a PNP bipolar transistor and an NPN bipolar transistor, which are cross-coupled, and an electrical connection between a collector of the PNP bipolar transistor and a collector of the NPN bipolar transistor. This enables the ohmic thyristor to have both thyristor characteristics and ohmic characteristics based on a level of current flow.
priorityDate 2019-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 28.